Surface Analysis
Bruker Dektak XT
Stylus Profilometer
This stylus profiler can be used to perform nanometer scale height, step and surface roughness measurements on an array of sample types. The Dektak XT features an innovative single-arch design that provides excellent platform stability along with "smart electronics" that results in a low-noise system. Dektak is the only stylus profiler to measure large vertical features of sensitive materials (up to 1mm tall) with angstrom-level repeatability
Dektak Stylus Profilometer
The applications for this system are numerous:
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Thin Film Inspection - monitoring deposition and etch rates and thin film stresses.
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Surface Roughness Verification
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Microfluidics — Verifying Design and Performance
| Prices: | |
| Academic: | €5/hr |
| Industry: |
On request |
| Contact: | |
| Admin: | research.facilities@dcu.ie |
| Technical: | barry.oconnell@dcu.ie |
Bruker Contour GT 3D
Optical Profilometer
Contour Optical Profiler
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Unique metrology sensor design with patented dual-LED light source
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Self-calibrating, metrology optimizing laser reference
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Integral vibration-isolation floor-mount cabinet
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Fully automated measurement capabilities (focus, intensity, tip/tilt head, staging, FOV)
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Nanometer-scale resolution on high-contour surfaces
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Streamlined, customizable production interface
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Real-time automated measurement optimization
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Extensive library of filters and customizable analysis options
| Prices: | |
| Academic: | €5/hr |
| Industry: |
On request |
| Contact: | |
| Admin: | research.facilities@dcu.ie |
| Technical: | barry.oconnell@dcu.ie |
Bruker Hysitron TI Premier
Nanoindenter
This is an automated nano-mechanical test instrument for measuring the hardness, elastic modulus, fracture toughness and other mechanical properties using controlled nanoindentation of materials. Imaging of indentations can then be carried out with the indenter head or the integrated optics. Our system is installed on low vibration platform, improving measurement quality.
Bruker Hysitron TI Premier Nanoindenter
The system has a range of applications which include:
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Investigating mechanical behavior of surfaces and ultra-thin coatings
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Measuring the modulus and mechanical properties of interfaces and individual phases
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Measuring the viscoelastic properties of polymers and biological materials down to the cellular level
| Prices: | |
| Academic: | €13/hr |
| Industry: |
On request |
| Contact: | |
| Admin: | research.facilities@dcu.ie |
| Technical: | barry.oconnell@dcu.ie |
FTA200
Dynamic Contact Angle Analyser
This analyser has a flexible video system which is used for measuring Contact Angle, Surface Tension, Interfacial Tension, Wettability and Absorption. Surface Energy can also be measured as a direct function of Surface Tension and/or Contact Angle.
Contact Angle Analyser
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The software can calculate many quantities of interest from the drop shape, including: static, equilibrium, capillary, advancing & receding Contact Angle
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Pendant drop & sessile drop Surface Tension
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Pendant drop & drop volume Interfacial Tension
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Sessile drop Spreading and Adsorption
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Critical Micelle Concentration & Critical Wetting Tension.
| Prices: | |
| Academic: | €6/hr |
| Industry: |
On request |
| Contact: | |
| Admin: | research.facilities@dcu.ie |
| Technical: | stephen.fuller@dcu.ie |